automatic test generation

常見(jiàn)例句

The implementation of automatic test generation and fault diagnosis is also discussed.
還討論了測(cè)試碼自動(dòng)生成和故障診斷的具體實(shí)現(xiàn)方法。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
本文主要是對(duì)大規(guī)模、超大規(guī)模集成電路寄存器傳輸級(jí)（RTL）的自動(dòng)測(cè)試產(chǎn)生算法進(jìn)行研究。
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on self- adapting algorithm and uses a seventeen - valued logic model.
本文提出了一種高效的時(shí)序電路測(cè)試生成算法，該算法是建立在自適應(yīng)算法的基礎(chǔ)上，并使用了十七值邏輯模型。