electron emission microscopy

常見例句

In this paper principle and application of Ballistic Electron Emission Microscopy (BEEM) is described. Some results obtained with home made setup of BEEM are shown.
本文簡單介紹了彈道電子發(fā)射顯微鏡（BEEM）的原理和應(yīng)用，并給出了用自行研制的BEEM設(shè)備得到的一些實驗結(jié)果。
Two methods used in the microanalysis of semiconductor interfaces, Ballistic Electron Emission Microscopy (BEEM)and Scanning Internal Photoemission Microscopy (SIPM), are described.
介紹了可以在微觀級對半導體界面的電學性質(zhì)進行評價的兩種新技術(shù)及其應(yīng)用。
The structures of the composite films were characterized by field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR) and thermo gravimetric analysis (TGA).
采用場發(fā)射掃描電鏡（FESEM）、紅外光譜（FTIR）、熱重分析（TGA）等方法對復合膜結(jié)構(gòu)進行表征。
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