field ion microscope
常見例句
- Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.
采用聚焦離子束和場發(fā)射掃描電鏡對處于臨界破壞狀態(tài)的節(jié)瘤缺陷做剖面分析和觀察。 返回 field ion microscope