reflection electron microscopy

基本解釋

The surface of synthetic diamond have been observed employing reflection electron microscopy with both TBM and STEM instrument.
本文用反射電子顯微術觀察了合成金剛石表面。
Through the infrared reflection spectroscopy, scanning electron microscopy, electrochemical impedance spectroscopy, contact angle to do depth analysis and testing.
通過紅外反射光譜，掃描電鏡，電化學交流阻抗，耐化學介質(zhì)等手段對涂料進行了深入的分析和測試。
The surface microstructures of spherical Pt single crystals are studied by reflection electron microscopy, and the defect configurations in the crystals are also analysed.
本文用反射電子顯微術觀察了球狀鉑單晶表面的微觀結(jié)構，分析了單晶形成中內(nèi)部缺陷的變化。