test data volume

基本解釋

Recently, reducing test application time and test data volume is a direction of effort in SoC design .
目前，減少測試應(yīng)用時間和測試數(shù)據(jù)容量是測試領(lǐng)域的努力方向。
There are three serious problems: These are test application time, test data volume, and test power consumption.
其中比較嚴(yán)重的問題有三個：它們分別是測試時間、測試數(shù)據(jù)量和測試功耗。
Estimate the test data requirements and identify ways of creating an adequate volume of valid test data for volume and load testing.
估算測試數(shù)據(jù)需求并確定創(chuàng)建足夠的有效測試數(shù)據(jù)量以進行容量和負載測試。