transmission electron microscopy tem

基本解釋

A TecnaiG220AEM instrument was used for the transmission electron microscopy (TEM) study.
透射電鏡（TEM）采用TecnaiG220AEM透射電鏡分析儀。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact angle measurements.
用掃描電鏡、透射電鏡、X射線衍射、接觸角測(cè)量等技術(shù)對(duì)表面進(jìn)行了表征。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). transmission electron microscopy (TEM) and atom force microscopy (AFM).
并用掃描電子顯微鏡（SEM）、透射電子顯微鏡（TEM）和原子力顯微鏡（AFM）對(duì)陽(yáng)極氧化鋁膜的形貌和結(jié)構(gòu)進(jìn)行了表征。