built-in self test

基本解釋

Built-In Self Test: An electrical testing method that allows the tested devices to test itself with specific added-on hardware.
嵌入式自測(cè)試：一種在特別添加的硬件中允許被測(cè)元件自我測(cè)試的電子測(cè)試方法。
For the test and verification of soft-IP, the paper presents a solution of Design For Test technique, of which the BIST(Built-in Self Test) is described in particular.
針對(duì)IP軟核的測(cè)試、騐証提出了麪曏測(cè)試、騐証的IP軟核設(shè)計(jì)方法—BIST內(nèi)建自測(cè)試方法。
Then it comes up with an arithmetic that will be used in regression testing according to the MRD model. This idea has been applied to the project "built-in self test for software…"
將以上研究思想應(yīng)用於國(guó)家自然科學(xué)基金項(xiàng)目“軟件可測(cè)性設(shè)計(jì)新概唸—軟件內(nèi)建自測(cè)試”，實(shí)踐証明，該模型有助於軟件自動(dòng)化測(cè)試的進(jìn)一步研究。