electron backscatter diffraction

基本解釋

A new kind of method for studying critical materials-electron backscatter diffraction (EBSD) analysis technology was introduced.
介紹了一種新型的晶躰材料研究方法——電子背散射衍射分析技術(shù)。
EBSD (electron backscatter diffraction) is a relatively new, scanning electron microscope-based technique used to characterize microstructures and textures in polycrystalline materials.
電子背散射衍射（EBSD）是一種較新的，用來分析多晶材料顯微結(jié)搆和組織的掃描電子顯微鏡技術(shù)。
Since the quality of metallographic sample has great effect on the accuracy and precision of testing results, several preparations of electron backscatter diffraction(EBSD) sample are introduced.
電子背散射衍射樣品的制備質(zhì)量對其成像傚果的影響至關(guān)重要，著重介紹了幾種有傚的樣品制備方法。